Seeing the unseen with Helios MX1 PFIB-SEM - Silicon Semiconductor News

Unlocking Hidden Insights with Helios MX1 PFIB-SEM

By integrating high-resolution laboratory instrumentation into the fab environment, Helios MX1 quickly reveals details that were previously only achievable in a lab, accelerating time-to-yield.

“With Helios MX1, semiconductor fab engineers can now see what was previously only visible in a laboratory,” said Mohan Iyer, semiconductor vice president and general manager at Thermo Fisher Scientific.

Helios MX1 provides fast, accurate, and valuable insights into semiconductor subsurface defects, addressing the industry's growing need for analysis within fabrication environments.

Author's summary: Helios MX1 reveals hidden semiconductor defects.

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Silicon Semiconductor Silicon Semiconductor — 2025-10-29